Single event upset - PDFSEARCH.IO - Document Search Engine

Single event upset
Results: 35

#	Item
31	Techniques for transient fault sensitivity analysis and reduction in VLSI circuits Atul Maheshwari, Israel Koren and Wayne Burleson Add to Reading List Source URL: euler.ecs.umass.edu Language: English - Date: 2011-01-27 16:46:18 Electromagnetism Computer memory Electronic design automation Logic gates Fault injection RC5 Soft error Single event upset Fault Electronic engineering Digital electronics Electronics
32	Incorporating Fault Tolerance in Analog-to-Digital Converters (ADCs) Mandeep Singh † and Israel Koren † Advanced Micro Devices, Austin, TX[removed]Department of Electrical and Computer Engineering Add to Reading List Source URL: euler.ecs.umass.edu Language: English - Date: 2011-01-27 16:46:18 Electronic circuits Electromagnetism Digital electronics Analog circuits Analog-to-digital converter Fault injection Successive approximation ADC Single event upset Sensitivity analysis Electronic engineering Electronics Digital signal processing
33	PDF Document Add to Reading List Source URL: radhome.gsfc.nasa.gov Language: English - Date: 2009-05-20 20:01:22 Reconfigurable computing Electronics manufacturing Xilinx Field-programmable gate array Radiation hardening Single event upset PowerPC Actel Multi-core processor Electronic engineering Electronics Fabless semiconductor companies
34	PDF Document Add to Reading List Source URL: pdf.yuri.se Language: English - Date: 2013-09-10 23:25:26 Computing Electronics Single event upset Dynamic random-access memory RAM parity Error detection and correction Neutron Random-access memory Cosmic ray Computer memory Physics Soft error
35	PDF Document Add to Reading List Source URL: crc.stanford.edu Language: English - Date: 2001-06-07 17:50:05 Electronic design automation Single event upset Electronic design Soft error Fault injection Scan chain Reliability engineering Microprocessor Logic simulation Electronic engineering Digital electronics Electronics

UPDATE